Dr. Jeong-Seok Oh
at Korea Institute of Machinery & Materials
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 3 September 2019
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Retroreflectors, 3D acquisition, Detection and tracking algorithms, Calibration, Distance measurement, 3D metrology, Optical tracking, Algorithm development, Signal detection, Pulsed laser operation

Proceedings Article | 3 September 2019
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Optical systems, Distance measurement, 3D metrology, Optical engineering, Laser metrology, Optical systems engineering, Positioning equipment

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