Jeong Yub Lee
at Samsung Advanced Institute of Technology
SPIE Involvement:
Publications (6)

Proceedings Article | 23 May 2018
Proc. SPIE. 10671, Metamaterials XI
KEYWORDS: Consumer electronics, Microscopes, Nanostructures, Imaging systems, Lenses, Dielectrics, Wavefronts, Digital cameras, Geometrical optics, Optical storage

Proceedings Article | 14 March 2018
Proc. SPIE. 10549, Complex Light and Optical Forces XII
KEYWORDS: Lithography, Spectrum analysis, Channel waveguides, Waveguides, Control systems, Integrated optics, Silicon photonics, Spiral phase plates, Infrared microscopy, Phase velocity

Proceedings Article | 31 August 2017
Proc. SPIE. 10354, Nanoengineering: Fabrication, Properties, Optics, and Devices XIV
KEYWORDS: Optical components, Nanostructures, Refractive index, Transparency, Sputter deposition, Dielectrics, Surface roughness, Oxygen, Radium, Phase shifts

Proceedings Article | 15 September 2016
Proc. SPIE. 9927, Nanoengineering: Fabrication, Properties, Optics, and Devices XIII
KEYWORDS: Oxides, Thin films, Nanostructures, Refractive index, Annealing, Crystals, Silicon, Surface roughness, Silicon films, Plasma enhanced chemical vapor deposition

Proceedings Article | 22 August 2009
Proc. SPIE. 7426, Optical Manufacturing and Testing VIII
KEYWORDS: Wafer-level optics, Actuators, Microfluidics, Silicon, Lens design, Oxygen, Liquid lenses, Semiconducting wafers, Electroactive polymers, Liquids

Showing 5 of 6 publications
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