Jeong Yub Lee
at Samsung Advanced Institute of Technology
SPIE Involvement:
Publications (7)

Proceedings Article | 21 August 2020 Presentation
Proc. SPIE. 11467, Nanoengineering: Fabrication, Properties, Optics, Thin Films, and Devices XVII
KEYWORDS: Nanostructures, Monochromatic aberrations, Finite-difference time-domain method, Lenses, Dielectrics, Wavefront sensors, Wavefronts, Phase shift keying, Wavefront analysis, Geometrical optics

Proceedings Article | 23 May 2018 Presentation
Proc. SPIE. 10671, Metamaterials XI
KEYWORDS: Consumer electronics, Microscopes, Nanostructures, Imaging systems, Lenses, Dielectrics, Wavefronts, Digital cameras, Geometrical optics, Optical storage

Proceedings Article | 14 March 2018 Presentation
Proc. SPIE. 10549, Complex Light and Optical Forces XII
KEYWORDS: Lithography, Spectrum analysis, Channel waveguides, Waveguides, Control systems, Integrated optics, Silicon photonics, Spiral phase plates, Infrared microscopy, Phase velocity

Proceedings Article | 31 August 2017 Paper
Proc. SPIE. 10354, Nanoengineering: Fabrication, Properties, Optics, and Devices XIV
KEYWORDS: Optical components, Nanostructures, Refractive index, Transparency, Sputter deposition, Dielectrics, Surface roughness, Oxygen, Radium, Phase shifts

Proceedings Article | 15 September 2016 Presentation + Paper
Proc. SPIE. 9927, Nanoengineering: Fabrication, Properties, Optics, and Devices XIII
KEYWORDS: Oxides, Thin films, Nanostructures, Refractive index, Annealing, Crystals, Silicon, Surface roughness, Silicon films, Plasma enhanced chemical vapor deposition

Showing 5 of 7 publications
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