Jérome Brossais
at PRYNEL
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | May 3, 2004
Proc. SPIE. 5303, Machine Vision Applications in Industrial Inspection XII
KEYWORDS: Feature extraction, Machine vision, Manufacturing, Inspection, Scene classification, Feature selection, Classification systems, Image processing, Statistical modeling, Light emitting diodes

PROCEEDINGS ARTICLE | May 1, 2003
Proc. SPIE. 5132, Sixth International Conference on Quality Control by Artificial Vision
KEYWORDS: Image segmentation, Image processing algorithms and systems, Field programmable gate arrays, Image classification, Neural networks, Algorithm development, Image quality, Manufacturing, Reconfigurable computing, Detection and tracking algorithms

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