Jérome Brossais
at PRYNEL
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | May 3, 2004
Proc. SPIE. 5303, Machine Vision Applications in Industrial Inspection XII
KEYWORDS: Light emitting diodes, Image processing, Manufacturing, Inspection, Feature extraction, Machine vision, Feature selection, Scene classification, Statistical modeling, Classification systems

PROCEEDINGS ARTICLE | May 1, 2003
Proc. SPIE. 5132, Sixth International Conference on Quality Control by Artificial Vision
KEYWORDS: Image processing algorithms and systems, Reconfigurable computing, Detection and tracking algorithms, Image segmentation, Manufacturing, Field programmable gate arrays, Image quality, Neural networks, Image classification, Algorithm development

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