Dr. Jérôme M. Vaillant
at CEA-LETI
SPIE Involvement:
Author
Area of Expertise:
CMOS image sensor , Optical simulation , Wavefront sensor , Adaptive Optics
Publications (18)

Proceedings Article | 26 March 2019 Paper
Proc. SPIE. 10958, Novel Patterning Technologies for Semiconductors, MEMS/NEMS, and MOEMS 2019
KEYWORDS: Photomasks, Chromium, Microlens, 3D modeling, Atomic force microscopy, Grayscale lithography, Lithography, Photoresist processing, Diffraction, Microlens array

Proceedings Article | 24 May 2018 Presentation + Paper
Proc. SPIE. 10677, Unconventional Optical Imaging
KEYWORDS: Sensors, Signal to noise ratio, Image sensors, Reflectivity, Near infrared, Databases

Proceedings Article | 24 January 2011 Paper
Proc. SPIE. 7876, Digital Photography VII
KEYWORDS: Signal to noise ratio, Visualization, Sensors, Image processing, Cameras, RGB color model, Optical resolution, Image resolution, Image sensors, Colorimetry

Proceedings Article | 24 January 2011 Paper
Proc. SPIE. 7876, Digital Photography VII
KEYWORDS: Optical filters, Quantum efficiency, Optical lithography, Transistors, Silicon, Sensors, Image resolution, Optical resolution, Image sensors, Metals

Proceedings Article | 24 January 2011 Paper
Proc. SPIE. 7876, Digital Photography VII
KEYWORDS: Quantum efficiency, Sensors, Image sensors, Image quality, Image processing, Signal to noise ratio, Device simulation, Cameras, Microlens, CMOS sensors

Showing 5 of 18 publications
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