Prof. Jerzy B. Pelka
at Institute of Physics
SPIE Involvement:
Author
Publications (11)

Proceedings Article | 14 May 2019
Proc. SPIE. 11035, Optics Damage and Materials Processing by EUV/X-ray Radiation VII
KEYWORDS: Optical filters, Signal attenuation, Metals, X-rays, Silicon, Laser ablation, Extreme ultraviolet, Aluminum, X-ray lasers, Free electron lasers

Proceedings Article | 21 June 2017
Proc. SPIE. 10236, Damage to VUV, EUV, and X-ray Optics VI
KEYWORDS: Photons, Electrons, Materials processing, Physics, Raman spectroscopy, Analytical research, Free electron lasers, States of matter, Stanford Linear Collider, Lead

Proceedings Article | 19 May 2011
Proc. SPIE. 8077, Damage to VUV, EUV, and X-ray Optics III
KEYWORDS: Polymethylmethacrylate, Signal attenuation, X-rays, Laser ablation, Extreme ultraviolet, Laser damage threshold, X-ray lasers, Free electron lasers, Liquid crystal lasers, Lead

Proceedings Article | 18 May 2009
Proc. SPIE. 7361, Damage to VUV, EUV, and X-Ray Optics II
KEYWORDS: Mirrors, Chemical species, Spectroscopy, Copper, Ions, Silicon, Emission spectroscopy, Aluminum, Free electron lasers, Plasma

Proceedings Article | 18 May 2009
Proc. SPIE. 7361, Damage to VUV, EUV, and X-Ray Optics II
KEYWORDS: Gaussian beams, Polymethylmethacrylate, Signal attenuation, Chemical species, X-rays, Surface roughness, Atomic force microscopy, Laser ablation, Solids, X-ray lasers

Proceedings Article | 18 May 2009
Proc. SPIE. 7361, Damage to VUV, EUV, and X-Ray Optics II
KEYWORDS: Femtosecond phenomena, Sensors, Crystals, Silicon, Optical microscopy, Atomic force microscopy, Extreme ultraviolet, Laser damage threshold, Free electron lasers, Absorption

Showing 5 of 11 publications
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