Jerzy Stachera
at Warsaw Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 February 2008
Proc. SPIE. 6811, Real-Time Image Processing 2008
KEYWORDS: Signal to noise ratio, Visualization, Wavelets, Surface roughness, Computer programming, Volume rendering, Quantization, Reconstruction algorithms, Computer graphics, Antimony

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