Augmented Reality (AR) waveguide metrology requires placing the measurement camera next to the projection optics, thereby complicating system referencing, which requires the camera to be opposite to the projection optics, not next to it. The traditional mechanical solution of rotating and repositioning the camera is expensive and error-prone. This paper introduces an innovative optical technique that eliminates physical adjustments, thus reducing risk, cost and complexity in AR waveguide metrology referencing. We demonstrate that this new optical method provides referencing equal to the classical mechanical approach. This innovative technique has the potential to significantly simplify AR waveguide metrology, providing a cost-effective and risk-reduced method for quality control metrology.
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