Jirí Vodák
Faculty of Mechanical Eng at Brno Univ of Technology
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 24 September 2015
Proc. SPIE. 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
KEYWORDS: Thin films, Refractive index, Spectroscopy, Gallium arsenide, Imaging spectroscopy, Atomic force microscopy, Data processing, Spectroscopic ellipsometry, Reflectance spectroscopy, Intelligence systems

Proceedings Article | 24 September 2015
Proc. SPIE. 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
KEYWORDS: Thin films, Ellipsometry, Spectroscopy, Reflectivity, Imaging spectroscopy, CCD cameras, Reflectometry, Spectroscopic ellipsometry, Reflectance spectroscopy, Intelligence systems

Proceedings Article | 24 September 2015
Proc. SPIE. 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
KEYWORDS: Scattering, Sensors, Solar cells, Crystals, Silicon, Solids, Mechanical engineering, Scatter measurement, Signal detection, Electromagnetic scattering

Proceedings Article | 23 September 2015
Proc. SPIE. 9626, Optical Systems Design 2015: Optical Design and Engineering VI
KEYWORDS: Thin films, Mirrors, Beam splitters, Cameras, Spectroscopy, Imaging spectroscopy, Pellicles, Reflectometry, Reflectance spectroscopy, Intelligence systems

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