Jiachao Li
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 November 2019
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Fringe analysis, Spatial frequencies, Composites, Fourier transforms, Multiplexing, 3D metrology, Neural networks, Phase measurement, Electroluminescent displays, Phase shifts

Proceedings Article | 16 October 2019
Proc. SPIE. 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019)
KEYWORDS: Mirrors, Imaging systems, Cameras, Calibration, Clouds, 3D modeling, 3D metrology, Projection systems, Light sources and illumination, Data conversion

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