Dr. Jian Guo
at Technische Univ Delft
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 15, 2012
Proc. SPIE. 8250, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
KEYWORDS: Microelectromechanical systems, Sun, Stars, Aerospace engineering, Sensors, Satellites, Silicon, Reliability, Gyroscopes, Space operations

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top