The organic light-emitting diode (OLED) has demonstrated its novelty in displays and certain lighting applications. Similar to white light-emitting diode (LED) technology, it also holds the promise of saving energy. Even though the luminous efficacy values of OLED products have been steadily growing, their longevity is still not well understood. Furthermore, currently there is no industry standard for photometric and colorimetric testing, short and long term, of OLEDs. Each OLED manufacturer tests its OLED panels under different electrical and thermal conditions using different measurement methods. In this study, an imaging-based photometric and colorimetric measurement method for OLED panels was investigated. Unlike an LED that can be considered as a point source, the OLED is a large form area source. Therefore, for an area source to satisfy lighting application needs, it is important that it maintains uniform light level and color properties across the emitting surface of the panel over a long period. This study intended to develop a measurement procedure that can be used to test long-term photometric and colorimetric properties of OLED panels. The objective was to better understand how test parameters such as drive current or luminance and temperature affect the degradation rate. In addition, this study investigated whether data interpolation could allow for determination of degradation and lifetime, L70, at application conditions based on the degradation rates measured at different operating conditions.
Light flicker is a common but unwelcome phenomenon in conventional lighting applications. In solid-state lighting, driving or dimming methods also give rise to light flicker. AC LED products in today’s marketplace suffer from flicker, which stems from the arrangement of the micro-LEDs and the driving method. Research has shown that light flicker can be a health hazard to humans. Several solutions have been proposed to reduce light flicker in solid-state lighting applications; however, most have drawbacks in terms of power and other performance. This paper proposes a circuit design to reduce light flicker from AC LEDs while maintaining a normal power factor and high power efficiency. The circuit is composed of one resistive branch and one capacitive branch, and each branch drives a load which is made up of high-voltage LEDs. Percent flicker, power factor, and power efficiency were selected as three metrics, and their benchmarks were set to evaluate the performance of this circuit. Phase shift between the two branches was selected as a factor that could determine the circuit performance. The variations of percent flicker, power factor, and power efficiency as a function of phase shift were identified by theoretical analysis and were verified by experiments. The experimental results show that an optimal solution can be achieved for this circuit design at proper phase shift, where the benchmarks of the three metrics are reached.