Dr. Jiandong Han
at Beijing Univ of Posts and Telecommunications
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | February 3, 2009
Proc. SPIE. 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications
KEYWORDS: 3D acquisition, Visual process modeling, Data modeling, Imaging systems, Cameras, Sensors, Calibration, 3D modeling, Image registration, 3D metrology

PROCEEDINGS ARTICLE | December 31, 2008
Proc. SPIE. 7130, Fourth International Symposium on Precision Mechanical Measurements
KEYWORDS: Target detection, Image compression, 3D acquisition, Image processing, Image analysis, Image registration, Optical testing, 3D metrology, Target recognition, 3D image processing

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