Jianing Dai
at Soochow Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 November 2019
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Optical coherence tomography, Coating, Speckle, Image processing, Microscopes, Nondestructive evaluation

Proceedings Article | 18 November 2019
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Optical coherence tomography, Opacity, Nondestructive evaluation, 3D image reconstruction, Imaging systems, Optical imaging, Scattering media, Spatial resolution, Multilayers, Medical diagnostics

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