Dr. Jianming Hu
at Chongqing Normal Univ
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | February 8, 2012
Proc. SPIE. 8213, Optical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XVI
KEYWORDS: Optical coherence tomography, Near infrared, Imaging systems, Eye, Visible radiation, Reflectivity, Nerve, Retina, In vivo imaging, Sapphire lasers

PROCEEDINGS ARTICLE | February 9, 2009
Proc. SPIE. 7158, 2008 International Conference on Optical Instruments and Technology: Microelectronic and Optoelectronic Devices and Integration
KEYWORDS: Fiber lasers, GRIN lenses, Refractive index, Laser applications, Ion exchange, Lithography, Glasses, Semiconductor lasers, Laser development, Structured optical fibers

PROCEEDINGS ARTICLE | February 9, 2009
Proc. SPIE. 7158, 2008 International Conference on Optical Instruments and Technology: Microelectronic and Optoelectronic Devices and Integration
KEYWORDS: Beam shaping, GRIN lenses, Semiconductor lasers, Glasses, Refractive index, Matrices, Lens design, Gradient-index optics, Beam propagation method, Optical components

PROCEEDINGS ARTICLE | May 19, 2006
Proc. SPIE. 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Semiconducting wafers, Interferometers, Lithography, Time metrology, Wafer-level optics, Optical lithography, Optical testing, Tolerancing, Interferometry, Metrology

PROCEEDINGS ARTICLE | January 27, 2005
Proc. SPIE. 5645, Advanced Microlithography Technologies
KEYWORDS: Adaptive optics, Image quality, Semiconducting wafers, Optical alignment, Lithography, Calibration, Monochromatic aberrations, Line width roughness, Photoresist processing, Optical lithography

PROCEEDINGS ARTICLE | January 27, 2005
Proc. SPIE. 5645, Advanced Microlithography Technologies
KEYWORDS: Monochromatic aberrations, Binary data, Photomasks, Phase shifting, Image sensors, Diffraction, Coherence (optics), Wavefronts, Resolution enhancement technologies, Semiconducting wafers

Showing 5 of 6 publications
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