Dr. Jianming Zheng
at GE Global Research
SPIE Involvement:
Conference Program Committee | Author
Publications (3)

PROCEEDINGS ARTICLE | September 10, 2009
Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries
KEYWORDS: Statistical analysis, Detection and tracking algorithms, Denoising, Inspection, Clouds, Feature extraction, Data acquisition, Data processing, 3D metrology, Lead

PROCEEDINGS ARTICLE | October 13, 2006
Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV
KEYWORDS: Edge detection, Anisotropic filtering, Detection and tracking algorithms, Speckle, Sensors, Image analysis, Gaussian filters, Image filtering, Image enhancement, Phase shifts

PROCEEDINGS ARTICLE | August 14, 2006
Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis
KEYWORDS: Fringe analysis, Phase shifting, Error analysis, Inspection, Interferometry, CCD cameras, Data acquisition, Integrated optics, Algorithm development, Optimization (mathematics)

Conference Committee Involvement (1)
Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II
26 October 2004 | Philadelphia, Pennsylvania, United States
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