Mr. Jiansheng Xie
at Jiangsu Polytechnic Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 22, 2004
Proc. SPIE. 5564, Infrared Detector Materials and Devices
KEYWORDS: Semiconductors, Oxides, Vanadium, Argon, Annealing, Crystals, Ions, Resistance, Ion beams, Temperature metrology

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