Jianshuan Li
at National Institute of Metrology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Reflectors, Refractive index, Interferometers, Sensors, Calibration, Error analysis, Interferometry, Optical testing, Bismuth, Protactinium

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