Jiansu Qu
at Changcheng Institute of Metrology & Measurement
SPIE Involvement:
Publications (6)

Proceedings Article | 18 December 2023 Paper
Jia Ou, Tingfa Xu, Jiansu Qu, Yang Li
Proceedings Volume 12968, 129680J (2023) https://doi.org/10.1117/12.3003712
KEYWORDS: Photogrammetry, Calibration, Imaging systems, Cameras, Heart, 3D metrology, 3D image processing, Standards development, Optical scanning systems, Magnetism

Proceedings Article | 8 July 2022 Paper
Proceedings Volume 12282, 1228218 (2022) https://doi.org/10.1117/12.2616427
KEYWORDS: Measurement devices, Composites, Calibration, Control systems, Data storage, Switching, Manufacturing, Patents, Optical testing, Metrology

Proceedings Article | 8 July 2022 Paper
Proceedings Volume 12282, 122820Y (2022) https://doi.org/10.1117/12.2615497
KEYWORDS: LIDAR, Optimization (mathematics), Distance measurement, Measurement devices, Manufacturing equipment, Manufacturing, Instrument modeling, Environmental sensing, Analytical research, Visualization

Proceedings Article | 8 July 2022 Paper
Proceedings Volume 12282, 1228217 (2022) https://doi.org/10.1117/12.2616418
KEYWORDS: Rockets, Laser marking, Distance measurement, Detection and tracking algorithms, Optimization (mathematics), Algorithm development, Mathematical modeling, High speed photography, Cameras, Time metrology

Proceedings Article | 15 February 2022 Paper
Proceedings Volume 12166, 121664W (2022) https://doi.org/10.1117/12.2617393
KEYWORDS: 3D modeling, Global Positioning System, Optimization (mathematics), Instrument modeling, Distance measurement, Data modeling, Control systems, Sensing systems, Assembly equipment, Process modeling

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