Jiarui Liao
at Hong Kong Univ of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 January 2006 Paper
Proceedings Volume 6056, 605602 (2006) https://doi.org/10.1117/12.641558
KEYWORDS: 3D image processing, 3D metrology, Image processing, Fringe analysis, Cameras, CCD cameras, Binary data, Charge-coupled devices, Mathematical modeling, Projection systems

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