Dr. Jie He
at Sichuan Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 January 2006
Proc. SPIE. 6037, Device and Process Technologies for Microelectronics, MEMS, and Photonics IV
KEYWORDS: Vanadium, Annealing, Thin films, Transmittance, Crystals, Resistance, Ions, Statistical analysis, Optical properties, Temperature metrology

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