Dr. Jie He
at Sichuan Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 January 2006 Paper
Proc. SPIE. 6037, Device and Process Technologies for Microelectronics, MEMS, and Photonics IV
KEYWORDS: Vanadium, Thin films, Statistical analysis, Optical properties, Annealing, Crystals, Ions, Resistance, Transmittance, Temperature metrology

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