Dr. Jie Li Profile

Dr. Jie Li

at China Academy of Engineering Physics

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Author

Publications (10)

Proceedings Article | 20 December 2019

Automatic test system for multiwavelength laser-induced damage threshold measurements

Jie Li, Rongsheng Ba, Xinda Zhou, Yinbo Zheng, Lei Ding, Liqun Chai, Huan Ren, Xiaodong Tang

Proc. SPIE. 11209, Eleventh International Conference on Information Optics and Photonics (CIOP 2019)

KEYWORDS: Laser induced damage, Laser damage threshold

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Proceedings Article | 18 January 2019

Optimal modified lateral shearing interferometer for in-line damage morphology measurement

Jie Li, Rongsheng Ba, Xinda Zhou, Yinbo Zheng, Lei Ding, Jing Yuan, Liqun Chai

Proc. SPIE. 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment

KEYWORDS: Shearing interferometers, Laser induced damage, Optical coatings

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Proceedings Article | 18 January 2019

Multi-wavelength investigation of the influence of polarization orientation on bulk damage resistance of type I doubler KDP crystals

Yin-Bo Zheng, Rong-Sheng Ba, Xin-Da Zhou, Jie Li, Lei Ding , Jing Yuan , Hong-Lei Xu , Jin Na , Ya-Jun Li, Huan Ren , Xiao-dong Tang , Li-qun Chai

Proc. SPIE. 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment

KEYWORDS: Polarization, Crystals, Laser induced damage

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Proceedings Article | 2 November 2018

Compact lateral shearing interferometer based on circular modified Hartmann mask

Changzhe Peng, Feng Tang, Xiangzhao Wang, Abel Kamagara, Jie Li

Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V

KEYWORDS: Diffraction gratings, Diffraction, Shearing interferometers, Wavefronts, Wavefront sensors, Interferometers

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Proceedings Article | 5 March 2018

Research on precision grinding technology of large scale and ultra thin optics

Lian Zhou, Qiancai Wei, Jie Li, Xianhua Chen, Qinghua Zhang

Proc. SPIE. 10710, Young Scientists Forum 2017

KEYWORDS: Adaptive optics, Optics manufacturing, Optical components, Optical testing, Sensors

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Proceedings Article | 10 January 2018

A method for improving the measurement accuracy of lateral shearing interferometry

Jie Li, Feng Tang, Xiangzhao Wang, Rongsheng Ba, Xinda Zhou, Yinbo Zheng, Lei Ding, Bo Chen, Xiaoyu Yang, Jing Yuan

Proc. SPIE. 10618, 2017 International Conference on Optical Instruments and Technology: Advanced Optical Sensors and Applications

KEYWORDS: Wavefronts, Sensors, Zernike polynomials, Calibration, Interferometry, Monochromatic aberrations, Error analysis, Extreme ultraviolet, Geometrical optics, Shearing interferometers

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Proceedings Article | 24 October 2017

An accurate method for investigation of laser-induced damage of optical component at 351nm

Xinda Zhou, Lei Ding, Yinbo Zheng, Jie Li, Rongsheng Ba, Honglei Xu, Jing Yuan, Bo Chen

Proc. SPIE. 10457, AOPC 2017: Laser Components, Systems, and Applications

KEYWORDS: Laser induced damage, Optical components, Silica, Laser damage threshold

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Proceedings Article | 24 October 2017

Preliminary study of the influence of polarization orientation on bulk damage resistances of doubler KDP crystals

YinBo Zheng, RongSheng Ba, XinDa Zhou, Jie Li, Jing Yuan, HongLei Xu, Jin Na, YaJun Li, Lei Ding, XiaoYu Yang, Liqun Chai, Bo Chen, WanGuo Zheng

Proc. SPIE. 10457, AOPC 2017: Laser Components, Systems, and Applications

KEYWORDS: Crystals, Polarization, Crystallography

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SPIE Journal Paper | 22 February 2017

Method for improving measurement efficiency of lateral shearing interferometry

Jie Li, Feng Tang, Xiangzhao Wang, Fengzhao Dai, Lei Ding, Bo Chen, Xiaoyu Yang, Liqun Chai

OE Vol. 56 Issue 02

KEYWORDS: Wavefronts, Error analysis, Zernike polynomials, Interferometry, Wavefront reconstruction, Optical engineering, Computer simulations, Statistical analysis, Optical testing, Sensors

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Proceedings Article | 13 March 2015

Calibration of system errors in lateral shearing interferometer for EUV-wavefront metrology

Jie Li, Feng Tang, Xiangzhao Wang, Fengzhao Dai, Feibin Wu

Proc. SPIE. 9422, Extreme Ultraviolet (EUV) Lithography VI

KEYWORDS: Wavefronts, Sensors, Monochromatic aberrations, Calibration, Extreme ultraviolet lithography, Interferometry, Extreme ultraviolet, EUV optics, Zernike polynomials, Error analysis

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Showing 5 of 10 publications

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