Dr. Jieran Fang
Senior Engineer at ASML US, Inc.
SPIE Involvement:
Author
Area of Expertise:
Optics , Computational Electromagnetics , Nanophotonics , Computational Lithography
Publications (6)

PROCEEDINGS ARTICLE | September 21, 2017
Proc. SPIE. 10343, Metamaterials, Metadevices, and Metasystems 2017
KEYWORDS: Photodetectors, Photovoltaics, Silica, Graphene, Sensors, Glasses, Electrons, Fractal analysis, Photovoltaic detectors, Absorption

PROCEEDINGS ARTICLE | November 9, 2016
Proc. SPIE. 9918, Metamaterials, Metadevices, and Metasystems 2016
KEYWORDS: Photodetectors, Plasmonics, Photovoltaics, Polarization, Graphene, Interfaces, Fractal analysis, CMOS technology, Photovoltaic detectors, Absorption

PROCEEDINGS ARTICLE | October 5, 2015
Proc. SPIE. 9546, Active Photonic Materials VII
KEYWORDS: Plasmonics, Finite-difference time-domain method, Indium, Silver, Inspection, 3D modeling, Numerical analysis, Differential equations, Epoxies, Light-matter interactions

PROCEEDINGS ARTICLE | September 11, 2013
Proc. SPIE. 8806, Metamaterials: Fundamentals and Applications VI
KEYWORDS: Finite-difference time-domain method, Graphene, Electrodes, Silver, Computer simulations, 3D modeling, Scanning electron microscopy, Transmittance, Technetium, Nanowires

PROCEEDINGS ARTICLE | September 10, 2011
Proc. SPIE. 8093, Metamaterials: Fundamentals and Applications IV
KEYWORDS: Finite-difference time-domain method, Nanoantennas, Polarization, Metals, Dielectrics, Silver, Near field scanning optical microscopy, Near field, Antennas, Near field optics

SPIE Journal Paper | January 1, 2011
JNP Vol. 5 Issue 01
KEYWORDS: Metals, 3D modeling, Composites, Particles, Silver, Scanning electron microscopy, Finite-difference time-domain method, Dielectrics, Computer simulations, 3D image processing

Showing 5 of 6 publications
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