Prof. Jihua Chen
at Beihang Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 20, 2009
Proc. SPIE. 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Imaging systems, Cameras, Calibration, Image processing, Manufacturing, Inspection, Digital cameras, Feature extraction, Machine vision, Bridges

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top