Dr. Jihui Wang
Assistant Professor at
SPIE Involvement:
Author
Publications (9)

PROCEEDINGS ARTICLE | June 9, 2014
Proc. SPIE. 9071, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV
KEYWORDS: Thermography, Imaging systems, Analytical research, Target acquisition, Minimum resolvable temperature difference, Performance modeling, Eye models, Thermal modeling, Systems modeling, Targeting Task Performance metric

PROCEEDINGS ARTICLE | September 11, 2013
Proc. SPIE. 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
KEYWORDS: Thermography, Signal to noise ratio, Imaging systems, Target acquisition, Minimum resolvable temperature difference, Performance modeling, Eye models, Thermal modeling, Systems modeling, Targeting Task Performance metric

PROCEEDINGS ARTICLE | September 11, 2013
Proc. SPIE. 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
KEYWORDS: Target detection, Staring arrays, Thermography, Imaging systems, Optical simulations, Modulation transfer functions, Minimum resolvable temperature difference, Performance modeling, Thermal modeling, Systems modeling

PROCEEDINGS ARTICLE | September 8, 2011
Proc. SPIE. 8193, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications
KEYWORDS: Target detection, Infrared search and track, Thermography, Signal to noise ratio, Detection and tracking algorithms, Imaging systems, Sensors, Transmittance, Thermal modeling, Atmospheric optics

PROCEEDINGS ARTICLE | September 8, 2011
Proc. SPIE. 8193, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications
KEYWORDS: Staring arrays, Thermography, Eye, Imaging systems, Sensors, Optical simulations, Modulation transfer functions, Minimum resolvable temperature difference, Thermal modeling, Systems modeling

PROCEEDINGS ARTICLE | November 5, 2010
Proc. SPIE. 7854, Infrared, Millimeter Wave, and Terahertz Technologies
KEYWORDS: Microelectromechanical systems, Thermography, Infrared imaging, Microscopes, Light emitting diodes, Microscopy, Silicon, Reliability, Electronic components, Photomicroscopy

Showing 5 of 9 publications
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