Dr. Jin-Ha Kim
Principal Engineer at SAMSUNG Electro-Mechanics
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 26 August 2008
Proc. SPIE. 7032, Plasmonics: Metallic Nanostructures and Their Optical Properties VI
KEYWORDS: Plasmons, Surface plasmons, Quantum wells, Light emitting diodes, Finite-difference time-domain method, Metals, Quantum efficiency, Gallium nitride, Solids, Internal quantum efficiency

Proceedings Article | 13 February 2007
Proc. SPIE. 6486, Light-Emitting Diodes: Research, Manufacturing, and Applications XI
KEYWORDS: Light emitting diodes, Photography, Resistance, LCDs, LED backlight, Transmittance, Field effect transistors, Green light emitting diodes, Temperature metrology, Blue light emitting diodes

Proceedings Article | 5 October 2006
Proc. SPIE. 6352, Optoelectronic Materials and Devices
KEYWORDS: Thermal optics, Modulation, Waveguides, Dispersion, Silicon, Photonic crystals, Modulators, Diodes, Optical simulations, Electro optics

Proceedings Article | 4 October 2006
Proc. SPIE. 6351, Passive Components and Fiber-based Devices III
KEYWORDS: Packaging, Refractive index, Optical design, Cladding, Glasses, Ultraviolet radiation, Optical testing, Epoxies, Helium, Temperature metrology

Proceedings Article | 22 February 2006
Proc. SPIE. 6134, Light-Emitting Diodes: Research, Manufacturing, and Applications X
KEYWORDS: Optical filters, Light emitting diodes, LCDs, Televisions, LED backlight, Transmittance, Green light emitting diodes, Temperature metrology, RGB color model, Blue light emitting diodes

Proceedings Article | 24 May 2004
Proc. SPIE. 5375, Metrology, Inspection, and Process Control for Microlithography XVIII
KEYWORDS: Light sources, Metrology, Light scattering, Scanning electron microscopy, Scatterometry, Time metrology, Process control, Critical dimension metrology, Semiconducting wafers, Scatter measurement

Showing 5 of 8 publications
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