CONFERENCE PROCEEDINGS
Advanced Search
Jin-Uk Park
at Kyungpook National Univ
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 24 February 2009 Paper
Nanorod measurement-layer separate structure for nanorod-character measurement, simulation, and application as sensor devices
Myoung-Kun Leem, Jin-Uk Park, Chang-Man Kim, Kyu-Jin Kim, Se-Hyuk Yeom, Woo-Youp Choi, Won-Seok Kang, Jae-Ho Kim, Shin-Won Kang
Proceedings Volume 7204, 72040P (2009) https://doi.org/10.1117/12.808673
KEYWORDS: Nanolithography, Dielectrophoresis, Gold, Silver, Electrodes, Silicon, Sensors, Semiconductors, Finite element methods, Nanorods
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top