Jin Peng
at Southwest Jiaotong Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 May 2009
Proc. SPIE. 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Spatial frequencies, Cameras, Calibration, Image processing, Error analysis, Fourier transforms, Computer simulations, CCD cameras, 3D metrology, Projection systems

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