Dr. Jin Wang Profile

Dr. Jin Wang

Researcher at

SPIE Involvement:

Conference Program Committee | Author

Publications (13)

PROCEEDINGS ARTICLE | August 23, 2017

Micromirror-based manipulation of synchrotron x-ray beams

Proc. SPIE. 10386, Advances in X-Ray/EUV Optics and Components XII

KEYWORDS: Microelectromechanical systems, Diffraction, Optical design, X-ray optics, Modulation, X-rays, Reflectivity, Micromirrors, Synchrotrons, Geometrical optics

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PROCEEDINGS ARTICLE | August 23, 2017

Application of MEMS-based x-ray optics as tuneable nanosecond choppers

Proc. SPIE. 10386, Advances in X-Ray/EUV Optics and Components XII

KEYWORDS: Microelectromechanical systems, X-ray optics, Modulation, X-rays, Silicon, Modulators, Micromirrors, Synchrotrons, Picosecond phenomena, EUV optics

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PROCEEDINGS ARTICLE | March 19, 2015

Grazing-incidence small angle x-ray scattering studies of nanoscale polymer gratings

Proc. SPIE. 9424, Metrology, Inspection, and Process Control for Microlithography XXIX

KEYWORDS: Statistical analysis, Data modeling, Scattering, Polymers, X-rays, Reflectivity, Atomic force microscopy, Grazing incidence, Statistical modeling, Systems modeling

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PROCEEDINGS ARTICLE | October 15, 2012

Temporal modulation of synchrotron x-rays using torsional MEMS mirrors

Proc. SPIE. 8502, Advances in X-Ray/EUV Optics and Components VII

KEYWORDS: Microelectromechanical systems, Mirrors, Modulation, Sensors, X-rays, Reflectivity, Control systems, Micromirrors, Measurement devices, Synchrotrons

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PROCEEDINGS ARTICLE | September 26, 2007

Mechanical design of a high-resolution x-ray powder diffractometer at the Advanced Photon Source

Proc. SPIE. 6665, New Developments in Optomechanics

KEYWORDS: Diffraction, Statistical analysis, Sensors, Crystals, X-rays, X-ray diffraction, Control systems, 3D modeling, Mechanical engineering, Motion analysis

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PROCEEDINGS ARTICLE | January 11, 2007

High-speed hard x-ray phase-enhanced imaging

Proc. SPIE. 6279, 27th International Congress on High-Speed Photography and Photonics

KEYWORDS: Phase contrast, X-rays, X-ray sources, Synchrotrons, Picosecond phenomena, Spatial resolution, X-ray imaging, Hard x-rays, Camera shutters, Absorption

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PROCEEDINGS ARTICLE | September 21, 2005

Single-pulse measurement of synchrotron radiation using an ultrafast x-ray streak camera

Proc. SPIE. 5920, Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications

KEYWORDS: Ultrafast phenomena, Ultrafast measurement systems, Microchannel plates, X-rays, Electrons, CCD cameras, Streak cameras, Transistors, Picosecond phenomena, Synchrotron radiation

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PROCEEDINGS ARTICLE | August 18, 2005

Self-assembly of nanoscale building blocks: an in situ study

Proc. SPIE. 5929, Physical Chemistry of Interfaces and Nanomaterials IV

KEYWORDS: Gold, Scattering, Chemical species, Particles, Molecules, X-rays, Interfaces, Chemistry, Nanocrystals, Superlattices

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PROCEEDINGS ARTICLE | October 26, 2004

Development of ultrafast computed tomography of highly transient fuel sprays

Proc. SPIE. 5535, Developments in X-Ray Tomography IV

KEYWORDS: Ultrafast phenomena, X-rays, Combustion, Fourier transforms, Tomography, Computed tomography, Synchrotrons, Reconstruction algorithms, Synchrotron radiation, X-ray detectors

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PROCEEDINGS ARTICLE | January 28, 2004

X-ray streak camera with 30-fs timing jitter

Proc. SPIE. 5194, Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors

KEYWORDS: Switches, Femtosecond phenomena, Laser energy, X-rays, Electrons, Gallium arsenide, Temporal resolution, Streak cameras, Laser stabilization, Pulsed laser operation

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PROCEEDINGS ARTICLE | February 5, 2003

New approach to jitter reduction of an x-ray streak camera in accumulation mode

Proc. SPIE. 4796, Low-Light-Level and Real-Time Imaging Systems, Components, and Applications

KEYWORDS: Ultrafast phenomena, Switches, Cameras, Laser energy, X-rays, Gallium arsenide, Wave plates, Streak cameras, Picosecond phenomena, Pulsed laser operation

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PROCEEDINGS ARTICLE | July 19, 1999

FEL development at the Advanced Photon Source

Proc. SPIE. 3614, Free-Electron Laser Challenges II

KEYWORDS: Electron beams, Light sources, Ultraviolet radiation, X-rays, Copper, Diagnostics, Medium wave, Vacuum ultraviolet, Free electron lasers, S band

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PROCEEDINGS ARTICLE | November 13, 1998

Metrology of a mirror at the Advanced Photon Source: comparison between optical and x-ray measurements

Proc. SPIE. 3447, Advances in Mirror Technology for Synchrotron X-Ray and Laser Applications

KEYWORDS: Mirrors, X-ray optics, Metrology, Error analysis, X-rays, Optical testing, CCD cameras, Synchrotron radiation, Monochromators, Optics manufacturing

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Showing 5 of 13 publications

Conference Committee Involvement (3)

Ultrafast X-Ray Sources and Detectors

26 August 2007 | San Diego, California, United States

Ultrafast X-Ray Detectors and Applications II

31 July 2005 | San Diego, California, United States

Ultrafast X-Ray Detectors and Applications

6 August 2003 | San Diego, California, United States

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