Dr. Jin Wang
Researcher
SPIE Involvement:
Conference Program Committee | Author
Publications (14)

Proceedings Article | 9 September 2019
Proc. SPIE. 11108, Advances in X-Ray/EUV Optics and Components XIV
KEYWORDS: Microelectromechanical systems, Diffraction, X-ray optics, Sensors, Crystals, X-rays, X-ray diffraction, Silicon, Micromirrors, Monochromators

Proceedings Article | 23 August 2017
Proc. SPIE. 10386, Advances in X-Ray/EUV Optics and Components XII
KEYWORDS: Microelectromechanical systems, X-ray optics, Modulation, X-rays, Silicon, Modulators, Micromirrors, Synchrotrons, Picosecond phenomena, EUV optics

Proceedings Article | 23 August 2017
Proc. SPIE. 10386, Advances in X-Ray/EUV Optics and Components XII
KEYWORDS: Microelectromechanical systems, Diffraction, Optical design, X-ray optics, Modulation, X-rays, Reflectivity, Micromirrors, Synchrotrons, Geometrical optics

Proceedings Article | 19 March 2015
Proc. SPIE. 9424, Metrology, Inspection, and Process Control for Microlithography XXIX
KEYWORDS: Statistical analysis, Data modeling, Scattering, Polymers, X-rays, Reflectivity, Atomic force microscopy, Grazing incidence, Statistical modeling, Systems modeling

Proceedings Article | 15 October 2012
Proc. SPIE. 8502, Advances in X-Ray/EUV Optics and Components VII
KEYWORDS: Microelectromechanical systems, Mirrors, Modulation, Sensors, X-rays, Reflectivity, Control systems, Micromirrors, Measurement devices, Synchrotrons

Showing 5 of 14 publications
Conference Committee Involvement (3)
Ultrafast X-Ray Sources and Detectors
26 August 2007 | San Diego, California, United States
Ultrafast X-Ray Detectors and Applications II
31 July 2005 | San Diego, California, United States
Ultrafast X-Ray Detectors and Applications
6 August 2003 | San Diego, California, United States
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