Prof. Jindong Tian
Professor of Optical Engineering at Shenzhen Univ
SPIE Involvement:
Author
Publications (31)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI
KEYWORDS: Light sources, Light emitting diodes, Wavelet transforms, 3D acquisition, Imaging systems, Cameras, Calibration, Fourier transforms, Distortion, 3D modeling, 3D metrology, Projection systems, Phase measurement, 3D image processing

PROCEEDINGS ARTICLE | November 24, 2016
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: Digital signal processing, Modulation, Imaging systems, Cameras, 3D modeling, 3D metrology, Projection systems, Embedded systems, Binary data, Structured light

PROCEEDINGS ARTICLE | March 10, 2015
Proc. SPIE. 9386, Practical Holography XXIX: Materials and Applications
KEYWORDS: Gaussian beams, Phase modulation, Cameras, Phase shift keying, Laser beam propagation, Optical testing, Liquid crystals, Zoom lenses, Beam propagation method, Standards development

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: 3D image reconstruction, Data modeling, Cameras, Image processing, 3D modeling, Image registration, 3D metrology, Algorithm development, 3D image processing, Range image registration

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Modulation, Imaging systems, Cameras, Calibration, Image processing, 3D metrology, Projection systems, 3D vision, Binary data, 3D image processing

PROCEEDINGS ARTICLE | November 20, 2012
Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II
KEYWORDS: Imaging systems, Cameras, Calibration, 3D modeling, Optical testing, 3D metrology, Projection systems, Stereo vision systems, 3D vision, Structured light

Showing 5 of 31 publications
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