Jing Li
at Jilin Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 12, 2004
Proc. SPIE. 5280, Materials, Active Devices, and Optical Amplifiers
KEYWORDS: Semiconductors, Atrial fibrillation, Reliability, Nondestructive evaluation, Power supplies, Semiconductor lasers, Measurement devices, Chemical analysis, Heterojunctions, Electrical breakdown

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