The low gain of single micro-channel plate (MCP) detector system has a lot of restrictions. So the dual MCP system is widely applied in many fields. Many experiments showed the gain was proportional to initial electron energy in single MCP system. If we improve the initial energy that collide with the second MCP in dual MCP system, it may have beneficial influence on the system gain. In order to check these hypothesis, we use the “Secondary Electric Field Acceleration” cascade structure in experiments. The results show the correctness through the comparison test with conventional 'V' type cascade structure. In this paper, we describe the different between these two structure and discuss the influence factors in their system gain. It gives a reference in the cascade system that with high gain and it also takes a great significance on the weak-light-detection field.
Comparing with the single micro-channel plate (MCP), the structure of cascaded micro-channel plates possesses the advantages of higher gain and lower dark current, etc. In order to improve its performance further, a structure of two-cascaded MCPs with accelerating electric field was raised. As noise characteristic is an important indicator to evaluate the performance of optoelectronic devices, therefore, it is of great significance to test the noise factor of two-cascaded MCPs. The structures of two-cascaded MCPs with and without accelerating electric field are taked as research object. Through changing their working conditions, the SNR of each situation were measured respectively. And the noise factor of each situation were deduced. The experimental results show that structure of two-cascade MCPs with the accelerating electric field possesses higher SNR and lower noise factor.