Jinmin Wu
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (3)

SPIE Journal Paper | 14 September 2019
OE Vol. 58 Issue 09

Proceedings Article | 21 June 2019
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Fringe analysis, Image processing, Error analysis, Fourier transforms, Demodulation, Image analysis, Optical interferometry, Fractional fourier transform, Lutetium, Commercial off the shelf technology

Proceedings Article | 21 June 2019
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Signal to noise ratio, Optical components, Fringe analysis, Convolutional neural networks, Detection and tracking algorithms, Image segmentation, Image processing, Fourier transforms, Image classification, Lutetium

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