Dr. Jinqiao Xie
at HexaTech Inc
SPIE Involvement:
Author
Publications (28)

Proceedings Article | 4 February 2013
Proc. SPIE. 8631, Quantum Sensing and Nanophotonic Devices X
KEYWORDS: Etching, Ultraviolet radiation, Interfaces, Atomic force microscopy, Gallium nitride, Sapphire, Aluminum nitride, Harmonic generation, Reactive ion etching, Metalorganic chemical vapor deposition

Proceedings Article | 4 March 2011
Proc. SPIE. 7939, Gallium Nitride Materials and Devices VI
KEYWORDS: Carbon, X-ray diffraction, Silicon, Diffusion, Doping, Gallium nitride, Silicon carbide, Metalorganic chemical vapor deposition, Gallium, Temperature metrology

Proceedings Article | 20 February 2009
Proc. SPIE. 7216, Gallium Nitride Materials and Devices IV
KEYWORDS: Semiconductors, Spectroscopy, Gallium nitride, Capacitance, Diodes, Aluminum, Metalorganic chemical vapor deposition, Heterojunctions, Spectroscopes, Temperature metrology

Proceedings Article | 20 February 2009
Proc. SPIE. 7216, Gallium Nitride Materials and Devices IV
KEYWORDS: Semiconductors, Thin films, Ferroelectric materials, Switching, Modulation, Electrodes, Gallium nitride, Field effect transistors, Heterojunctions, Ferroelectric capacitors

Proceedings Article | 20 February 2009
Proc. SPIE. 7216, Gallium Nitride Materials and Devices IV
KEYWORDS: Spectroscopy, Reliability, Heart, Gallium nitride, Measurement devices, Aluminum nitride, Field effect transistors, Heterojunctions, Spectroscopes, Temperature metrology

Proceedings Article | 20 February 2009
Proc. SPIE. 7216, Gallium Nitride Materials and Devices IV
KEYWORDS: Fluctuations and noise, Data modeling, Polarization, Metals, Nickel, Gallium nitride, Aluminum nitride, Field effect transistors, Heterojunctions, Scanning transmission electron microscopy

Showing 5 of 28 publications
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