Dr. Jinxiang Deng
at Beijing Univ of Technology
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | October 22, 2010
Proc. SPIE. 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
KEYWORDS: Thin films, FT-IR spectroscopy, Sputter deposition, Annealing, Crystals, Nickel, Silicon, Nitrogen, Boron, Absorption

PROCEEDINGS ARTICLE | August 24, 2009
Proc. SPIE. 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors
KEYWORDS: Thin films, Optical properties, Organic light emitting diodes, Ultraviolet radiation, Crystals, Optical microscopy, Transistors, Field effect transistors, Thin film growth, Absorption

PROCEEDINGS ARTICLE | August 24, 2009
Proc. SPIE. 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors
KEYWORDS: Thin films, FT-IR spectroscopy, Chemical species, Sputter deposition, Annealing, Silicon, Oxygen, Silicon films, Transmittance, Raman scattering

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