Dr. Jiping Guo
at Shenzhen Academy of Metrology & Quality Inspection
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | October 8, 2015
Proc. SPIE. 9677, AOPC 2015: Optical Test, Measurement, and Equipment
KEYWORDS: Optical imaging, Metrology, Statistical analysis, Imaging systems, Calibration, Inspection, Optical testing, Charge-coupled devices, Analytical research, Standards development

PROCEEDINGS ARTICLE | September 26, 2013
Proc. SPIE. 8856, Applications of Digital Image Processing XXXVI
KEYWORDS: Fringe analysis, Phase shifting, Real time imaging, 3D acquisition, Stereoscopy, Fourier transforms, Demodulation, Data acquisition, 3D image processing, Structured light

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top