Jiri Jankuj
at Meopta optika sro
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | September 24, 2015
Proc. SPIE. 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
KEYWORDS: Ellipsometry, Refractive index, Data modeling, Silica, Spectroscopy, Silicon, Optical coatings, Infrared spectroscopy, Systems modeling, Instrument modeling

PROCEEDINGS ARTICLE | September 27, 2011
Proc. SPIE. 8126, Optical Manufacturing and Testing IX
KEYWORDS: Thin films, Mirrors, Sensors, Image segmentation, Ultraviolet radiation, Reflectivity, Signal detection, Testing and analysis, Nonimaging optics, UV optics

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