At present there are known many of diagnostic methods of detection large crystal lattice defects of silicon solar cells. This paper deals about results of new potential in to use one of characteristics luminescence radiation for detection defects of solar cells. So polarization spectroscopy of defect in solar cells may be used to fitting characterization of silicon solar cells. And this can lead to understand the electrical properties of defects in silicon solar cells and study of really formation defects. We used extending existing electroluminescence technology about polarization spectroscopy to yield the polarization of luminescence radiation by defect in solar cells. Radiation emitted by the solar cell has a wave character that can interact with the silicon structures or hypothetically thin reflectance layer of solar cells. In our research we can observed the linear partially polarization luminescence light on poly-silicon crack defect. Spectral response of using CCD camera is approximately 300 to 1100 nm. Sinusoid dependence of luminescence intensity on the angle of linear polarization analyzer rotation shown this fact. The degree of polarization depends on the material, in this case the character of defect. Polarized light can be obtained in various ways. This fact opens up for potential next new questions in this widely course of study diagnostics defects silicon solar cells.
Two sets of c-Si solar cells varying in front side phosphorus doped emitters were produced by standard screen
printing technique. The first group of samples 3121 was prepared by combination of standard washing and bath with
and highly dilute HF before diffusion of n+-emitter. The second group of samples 3122 was treated only with standard
This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and
microplasma presence. As it was already shown in previous publications [1-3] noise spectral density reflects the quality
of solar cells and thus it represents an alternative advanced cell diagnostic tool. Our results confirm this relationship and
moreover bring the clear evidence for the maximum spectral noise voltage density being related with the emitter
structure. The best results were reached for a group of solar cell with of samples 3122 was treated only with standard
A non-destructive method of reliability prediction for PN junction microelectronic devices is presented.
Transport and noise characteristic of forward biased semiconductor lasers diodes GaSb based VCSE
(Vertical Cavity Surface Emitting) lasers were prepared by Molecular Beam Epitaxy were measured in order
to evaluate the new MBE technology.
This study is focused on testing methods determining quality of solar cells. Nowadays the development of solar cells is
much faster and there is still necessary to increase their quality by removing causes of materials defects and also defects
in a process of their production. Non-destructive methods are used for correct determination of defects by using of
recombination effect of charge carrier in PN junction. Due to these methods can be the solar cell diagnosed and
described. By using of various temperatures during the testing we can receive more objective results thanks to simulated
operation conditions. Peltier cells are used for graditional change of temperature. Cooling system with liquid nitro - LN2
is used to reach the very low temperature. Diagnostic and testing methods described in this study are based on emission
of light and the recombination processes in PN junction. It is especially electroluminescence and photoluminescence
method. For comparison it is used the observation of emitted light from microplasma method. Described methods detect
materials and process defects due to use of lownoise and very sensitive CCD camera.
Optical properties of different type of surface treatments of titanium biomaterial as polishing, grinding, and chemical etching are investigated in details. The main aim of this study is in sensing the organisation of nano-scale fibrinogen and oligonugleotides adhered on biomaterial surface. Thus permittivity change and the fluctuation in optical roughness of treated titanium surface, when titanium surface is subjected to the contamination of buffer fractions as well as to the contamination of human plasma fibrinogen fraction, are investigated through optical window of a cuvette by using diffractive optical element based sensor. During the progress of this work also optical ellipsometry as a corroborative method was used to verify the attachment of the molecules on the biomaterial surface.
This work deals with the usage of micro-plasmas signal noise for solar cells diagnostic. When high electric field is
applied to PN junction with some technological imperfections it produces in tiny areas of enhanced impact ionization
called micro-plasmas which could lead to deterioration in quality or destruction of PN junction. On this account it is
possible to use methods which indicate presence of micro-plasma in junction and enable quality and quantitative description of tested cells.
This paper is intended to present the results of our experimental study of three new types of silicon solar cells G1, G3
and G5. The study is based on an analysis of the device transport and noise characteristics. This analysis shows that
better quality (lower voltage noise spectral density) is exhibited by the structure of the groups of G3 specimens, this
junction (of a thickness of about 1 um) is etched away from the rear side.
Three different sets of semiconductors light active devices were by low frequency noise diagnostic described. In the first set the low frequency noise of 2.3 μm CW GaSb based Laser Diodes was measured, in set II the noise characteristic of forward biased silicon monocrystalline solar cells were measured and in set III the noise characteristic of forward biased Si:H amorphous solar cells were measured. The results of noise measurement in all systems were compared.