Dr. Jiubin Tan
at Harbin Institute of Technology
SPIE Involvement:
Author | Editor
Publications (64)

SPIE Journal Paper | 2 April 2020
OE Vol. 59 Issue 04
KEYWORDS: Heterodyning, Interferometers, Nonlinear optics, Demodulation, Signal processing, Optical engineering, Error analysis, Field programmable gate arrays, Computer simulations, Laser optics

SPIE Journal Paper | 5 June 2019
OE Vol. 58 Issue 06
KEYWORDS: Interferometers, Heterodyning, Zoom lenses, Nonlinear optics, Signal generators, Photodetectors, Ferroelectric materials, Laser sources, Electronics, Optical engineering

Proceedings Article | 7 March 2019 Paper
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Doppler effect, Interferometers, Error analysis, Field programmable gate arrays, Demodulation, Heterodyning, Phase measurement, Motion measurement

Proceedings Article | 7 March 2019 Paper
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Ferroelectric materials, Metrology, Fluctuations and noise, Sensors, Calibration, Error analysis, Manufacturing, Monte Carlo methods, Optoelectronics, Spatial resolution

Proceedings Article | 7 March 2019 Paper
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Optical imaging, Diffraction, Electromagnetic radiation, Transmittance, Electromagnetic interference, Microwave radiation, Electromagnetic coupling, Electromagnetism, Circuit switching, Device simulation

Showing 5 of 64 publications
Proceedings Volume Editor (5)

Conference Committee Involvement (9)
International High-Level Forum on High-End Measurement Instruments and 11th International Symposium on Precision Engineering Measurements and Instrumentation
8 August 2020 | Beijing, China
10th International Symposium on Precision Engineering Measurements and Instrumentation (ISPEMI 2018)
8 August 2018 | Kunming, China
Optical Precision Manufacturing, Testing, and Applications
22 May 2018 | Beijing, China
Optical Measurement Technology and Instrumentation
9 May 2016 | Beijing, China
International Symposium on Precision Engineering Measurement and Instrumentation 2014
8 August 2014 | Changsha/Zhangjiajie, China
Showing 5 of 9 Conference Committees
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