Mr. Jiwei Tian
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Confocal microscopy, Metrology, Lenses, Interferometers, Calibration, Laser development, Optical metrology, Precision measurement, Distance measurement, Laser systems engineering

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top