Jiyou Guo
Sr. Litho Process Engineer at Intel Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 July 2000
Proc. SPIE. 4000, Optical Microlithography XIII
KEYWORDS: Wafer-level optics, Reticles, Fourier transforms, Control systems, Printing, Image sensors, Charge-coupled devices, Critical dimension metrology, Data centers, Semiconducting wafers

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top