João R. C. Ricardo Melo
Doctoral Student at Univ Federal de Santa Catarina
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 13 May 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Profilometers, Cameras, Inspection, Laser optics, Mirrors, Corrosion, Image processing, Clouds, Calibration, Imaging systems

Proceedings Article | 15 October 2012
Proc. SPIE. 8498, Optics and Photonics for Information Processing VI
KEYWORDS: Inspection, Projection systems, Prototyping, 3D metrology, Photogrammetry, Phase shifting, Fringe analysis, Light sources, 3D modeling, Cameras

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