Dr. Joachim Barenz
Senior Engineer at Diehl Defence GmbH & Co KG
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | April 22, 2010
Proc. SPIE. 7662, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXI
KEYWORDS: Staring arrays, Mid-IR, Point spread functions, Imaging systems, Sensors, Optical testing, Collimators, Modulation transfer functions, Climatology, Temperature metrology

PROCEEDINGS ARTICLE | October 6, 2007
Proc. SPIE. 6737, Electro-Optical and Infrared Systems: Technology and Applications IV
KEYWORDS: 3D acquisition, Imaging systems, Cameras, Sensors, Stereoscopic cameras, 3D metrology, Micromirrors, Digital micromirror devices, Chemical elements, 3D image processing

PROCEEDINGS ARTICLE | May 19, 2005
Proc. SPIE. 5791, Laser Radar Technology and Applications X
KEYWORDS: Infrared sensors, Infrared imaging, Beam splitters, Optical amplifiers, Optical sensors, LIDAR, Sensors, Image sensors, Infrared radiation, Missiles

PROCEEDINGS ARTICLE | September 1, 2004
Proc. SPIE. 5459, Optical Sensing
KEYWORDS: Infrared sensors, Fiber amplifiers, Infrared imaging, Prisms, Optical sensors, Imaging systems, LIDAR, Sensors, Image sensors, Infrared radiation

PROCEEDINGS ARTICLE | September 24, 1997
Proc. SPIE. 3099, Micro-optical Technologies for Measurement, Sensors, and Microsystems II and Optical Fiber Sensor Technologies and Applications
KEYWORDS: Prisms, Waveguides, Sensors, Silicon, Atomic force microscopy, Near field scanning optical microscopy, Micromachining, Scanning probe microscopy, Microfabrication, Near field optics

PROCEEDINGS ARTICLE | April 15, 1997
Proc. SPIE. 3009, Micromachining and Imaging
KEYWORDS: Prisms, Waveguides, Sensors, Atomic force microscopy, Near field scanning optical microscopy, Near field, Aluminum, Scanning probe microscopy, Microfabrication, Near field optics

Showing 5 of 6 publications
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