Dr. Joachim John Profile

Dr. Joachim John

Section Head at imec

SPIE Involvement:

Author

Publications (19)

Proceedings Article | 5 May 2011 Paper

Paper

EUV detectors based on AlGaN-on-Si Schottky photodiodes

P. Malinowski, J.-Y. Duboz, P. De Moor, K. Minoglou, J. John, P. Srivastava, F. Semond, E. Frayssinet, A. BenMoussa, B. Giordanengo, C. Van Hoof, R. Mertens

Proceedings Volume 8073, 807302 (2011) https://doi.org/10.1117/12.886682

KEYWORDS: Silicon, Extreme ultraviolet, Sensors, Imaging systems, Photodiodes, Photodetectors, Semiconducting wafers, Ultraviolet radiation, Diodes, Aluminum

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Proceedings Article | 14 May 2010 Paper

Paper

AlGaN-on-Si backside illuminated photodetectors for the extreme ultraviolet (EUV) range

P. Malinowski, J.-Y. Duboz, J. John, C. Sturdevant, J. Das, J. Derluyn, M. Germain, P. De Moor, K. Minoglou, F. Semond, E. Frayssinet, J.-F. Hochedez, B. Giordanengo, C. Van Hoof, R. Mertens

Proceedings Volume 7726, 772617 (2010) https://doi.org/10.1117/12.853782

KEYWORDS: Extreme ultraviolet, Photodetectors, Sensors, Silicon, Gallium nitride, Etching, Ultraviolet radiation, Imaging systems, Visible radiation, Reactive ion etching

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Proceedings Article | 18 May 2009 Paper

Paper

Radiation hardness of AlxGa1-xN photodetectors exposed to Extreme UltraViolet (EUV) light beam

Pawel Malinowski, Joachim John, Frank Barkusky, Jean Yves Duboz, Anne Lorenz, Kai Cheng, Joff Derluyn, Marianne Germain, Piet De Moor, Kyriaki Minoglou, Armin Bayer, Klaus Mann, Jean-Francois Hochedez, Boris Giordanengo, Gustaaf Borghs, Robert Mertens

Proceedings Volume 7361, 73610T (2009) https://doi.org/10.1117/12.820691

KEYWORDS: Photodetectors, Gallium nitride, Extreme ultraviolet, Silicon, Photodiodes, Extreme ultraviolet lithography, Sun, Imaging systems, Gold, Sensors

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Proceedings Article | 26 April 2008 Paper

Paper

AlGaN photodetectors for applications in the extreme ultraviolet (EUV) wavelength range

Pawel Malinowski, Joachim John, Anne Lorenz, Patricia Aparicio Alonso, Marianne Germain, Joff Derluyn, Kai Cheng, Gustaaf Borghs, Robert Mertens, Jean Yves Duboz, Fabrice Semond, J.-F. Hochedez, A. BenMoussa

Proceedings Volume 7003, 70030N (2008) https://doi.org/10.1117/12.780948

KEYWORDS: Extreme ultraviolet, Gallium nitride, Photodetectors, Gold, Silicon, Diodes, Sensors, Photodiodes, Imaging systems, Metalorganic chemical vapor deposition

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Proceedings Article | 16 May 2007 Paper

Paper

Al_xGa_1-xN focal plane arrays for imaging applications in the extreme ultraviolet (EUV) wavelength range

J. John, P. Malinowski, P. Aparicio, G. Hellings, A. Lorenz, M. Germain, F. Semond, J.-Y. Duboz, A. BenMoussa, J.-F. Hochedez, U. Kroth, M. Richter

Proceedings Volume 6585, 658505 (2007) https://doi.org/10.1117/12.723023

KEYWORDS: Aluminum, Sensors, Gallium, Extreme ultraviolet, Diodes, Staring arrays, Quantum efficiency, Ultraviolet radiation, Calibration, Imaging arrays

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Proceedings Article | 8 September 2004 Paper

Paper

High-density hybrid interconnect technologies

Joachim John, Lars Zimmermann, Piet De Moor, Koen De Munck, Tom Borgers, Chris Van Hoof

Proceedings Volume 5454, (2004) https://doi.org/10.1117/12.546738

KEYWORDS: Sensors, Indium, Semiconducting wafers, Staring arrays, Silicon, Readout integrated circuits, Extreme ultraviolet, Infrared radiation, Ultraviolet radiation, Oxides

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Proceedings Article | 4 February 2004 Paper

Paper

Development of imaging arrays for solar UV observations based on wide band gap materials

Udo Schuehle, Jean-Francois Hochedez, Jose Luis Pau, Carlos Rivera, Elias Munoz, Jose Alvarez, Jean-Paul Kleider, Philippe Lemaire, Thierry Appourchaux, Bernhard Fleck, Anthony Peacock, Mathias Richter, Udo Kroth, Alexander Gottwald, Marie-Claude Castex, Alain Deneuville, Pierre Muret, Milos Nesladek, Franck Omnes, Joachim John, Chris Van Hoof

Proceedings Volume 5171, (2004) https://doi.org/10.1117/12.507730

KEYWORDS: Sensors, Ultraviolet radiation, Diamond, Vacuum ultraviolet, Charge-coupled devices, Microchannel plates, Photodiodes, Imaging arrays, Visible radiation, Photons

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Proceedings Article | 10 November 2003 Paper

Paper

Extended-wavelength InGaAs on GaAs hybrid image sensors

Joachim John, Lars Zimmermann, Patrick Merken, Stefan de Groote, Gustaaf Borghs, Chris Van Hoof, Stefan Nemeth, Thierry Colin

Proceedings Volume 5152, (2003) https://doi.org/10.1117/12.504519

KEYWORDS: Staring arrays, Indium gallium arsenide, Gallium arsenide, Indium, Readout integrated circuits, Near infrared, Short wave infrared radiation, Semiconducting wafers, Infrared radiation, Diodes

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Proceedings Article | 23 January 2003 Paper

Paper

Extended backside-illuminated InGaAs on GaAs IR detectors

Joachim John, Lars Zimmermann, Patrick Merken, Gustaaf Borghs, Chris Van Hoof, Stefan Nemeth

Proceedings Volume 4820, (2003) https://doi.org/10.1117/12.450563

KEYWORDS: Indium gallium arsenide, Gallium arsenide, Diodes, Staring arrays, Indium, Readout integrated circuits, Light emitting diodes, Short wave infrared radiation, Imaging spectroscopy, Gallium

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Proceedings Article | 10 October 2001 Paper

Paper

Extended InGaAs on GaAs detectors for SWIR linear sensors

Joachim John, Lars Zimmermann, Stefan Nemeth, Thierry Colin, Patrick Merken, Staf Borghs, Chris Van Hoof

Proceedings Volume 4369, (2001) https://doi.org/10.1117/12.445330

KEYWORDS: Sensors, Diodes, Gallium arsenide, Indium gallium arsenide, Short wave infrared radiation, Gallium, Manufacturing, Infrared sensors, Indium, Multiplexers

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Proceedings Article | 12 June 2001 Paper

Paper

InGaAs on GaAs extended wavelength linear detector arrays

Lars Zimmermann, Joachim John, Martijn de Weerd, Martin Slaman, Stefan Nemeth, Patrick Merken, Staf Borghs, Chris Van Hoof

Proceedings Volume 4288, (2001) https://doi.org/10.1117/12.429396

KEYWORDS: Sensors, Gallium arsenide, Indium gallium arsenide, Diodes, Silicon, Infrared sensors, Short wave infrared radiation, Temperature metrology, Indium arsenide, Diffusion

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Proceedings Article | 22 February 2001 Paper

Paper

Hybrid and monolithic infrared detector arrays

Chris Van Hoof, Lars Zimmermann, Joachim John, Piet De Moor, Spyros Kavadias, Martin Gastal, Stefan Nemeth, Gustaaf Borghs, Patrick Merken

Proceedings Volume 4355, (2001) https://doi.org/10.1117/12.417784

KEYWORDS: Sensors, Bolometers, Etching, Diodes, Detector arrays, Infrared detectors, Indium, Gallium arsenide, Semiconducting wafers, Infrared sensors

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Proceedings Article | 17 July 2000 Paper

Paper

InAsSb and InGaAs linear and focal plane arrays

Patrick Merken, Lars Zimmermann, Joachim John, Stefan Nemeth, Martin Gastal, Gustaaf Borghs, Chris Van Hoof

Proceedings Volume 4028, (2000) https://doi.org/10.1117/12.391737

KEYWORDS: Sensors, Diodes, Etching, Indium, Gallium arsenide, Indium arsenide, Detector arrays, Semiconducting wafers, Indium gallium arsenide, Silicon

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Proceedings Article | 17 July 2000 Paper

Paper

Linear arrays of fast uncooled poly-SiGe microbolometers for IR detection

Piet De Moor, Joachim John, Sherif Sedky, Chris Van Hoof

Proceedings Volume 4028, (2000) https://doi.org/10.1117/12.391754

KEYWORDS: Bolometers, Etching, Semiconducting wafers, Microbolometers, Silicon, Sensors, Infrared detection, Germanium, Packaging, Beam shaping

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Proceedings Article | 26 August 1997 Paper

Paper

PbSnSe-on-Si: material and IR-device properties

Hans Zogg, Alexander Fach, Joachim John, Peter Mueller, Carmine Paglino, A. Tiwari

Proceedings Volume 3182, (1997) https://doi.org/10.1117/12.280428

KEYWORDS: Infrared sensors, Tin, Selenium, Sensor technology, Lead, Molecular beam epitaxy, Annealing, Photodiodes, Resistance, Temperature metrology

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Proceedings Article | 22 October 1996 Paper

Paper

PbSnSe-on-Si infrared techniques: improvements in materials and devices

Hans Zogg, Alexander Fach, Joachim John, Peter Mueller, Carmine Paglino

Proceedings Volume 2816, (1996) https://doi.org/10.1117/12.255166

KEYWORDS: Infrared radiation, Infrared sensors, Thermography, Sensors, Temperature metrology, Photodiodes, Resistance, Etching, Lead, Molecular beam epitaxy

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Proceedings Article | 8 September 1995 Paper

Paper

Pb1-xSnxSe-on-Si LWIR thermal imaging system

Hans Zogg, Alexander Fach, Joachim John, Jiri Masek, Peter Mueller, Carmine Paglino, Werner Buttler

Proceedings Volume 2552, (1995) https://doi.org/10.1117/12.218240

KEYWORDS: Sensors, Thermography, Infrared sensors, Silicon, Lead, Long wavelength infrared, Imaging systems, Amplifiers, Photovoltaics, Fabrication

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Proceedings Article | 1 September 1995 Paper

Paper

Epitaxy of narrow gap IV-VI materials on Si(111) and Si(100) substrates: growth, properties, and thermal mismatch strain accommodation

Hans Zogg, Peter Mueller, Alexander Fach, Joachim John, Carmine Paglino, A. Tiwari

Proceedings Volume 2554, (1995) https://doi.org/10.1117/12.218196

KEYWORDS: Silicon, Interfaces, Scanning tunneling microscopy, Epitaxy, Temperature metrology, Infrared sensors, Lead, Cryogenics, Information operations, X-rays

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SPIE Journal Paper | 1 July 1995

Photovoltaic IV-VI on Si infrared sensor arrays for thermal imaging

Hans Zogg, Alexander Fach, Joachim John, Jiri Masek, Peter Mueller, Carmine Paglino, Stefan Blunier

OE, Vol. 34, Issue 07, (July 1995) https://doi.org/10.1117/12.10.1117/12.200617

KEYWORDS: Sensors, Silicon, Infrared sensors, Lead, Thermography, Photovoltaics, Staring arrays, Fabrication, Imaging arrays, Semiconducting wafers

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Showing 5 of 19 publications

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