CONFERENCE PROCEEDINGS
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Dr. Joachim J. Krueger
Senior Program Manager
SPIE Involvement:
Author
Publications (3)
Proceedings Article | 6 February 2007 Paper
Visible laser sources for projection displays
M. Jansen, G. Carey, R. Carico, R. Dato, A. Earman, M. Finander, G. Giaretta, S. Hallstein, H. Hofler, C. Kocot, S. Lim, J. Krueger, A. Mooradian, G. Niven, Y. Okuno, F. Patterson, A. Tandon, A. Umbrasas
Proceedings Volume 6489, 648908 (2007) https://doi.org/10.1117/12.716285
KEYWORDS: Projection systems, Televisions, Semiconductor lasers, Laser video displays, Light sources, Lamps, Light emitting diodes, RGB color model, LCDs, Laser sources
Proceedings Article | 17 June 2003 Paper
Studies of ESD-related failure patterns of Agilent oxide VCSELs
Joachim Krueger, Reena Sabharwal, Scott McHugo, Kimanh Nguyen, Ningxia Tan, Naginder Janda, Myrna Mayonte, Mike Heidecker, David Eastley, Mark Keever, Christopher Kocot
Proceedings Volume 4994, (2003) https://doi.org/10.1117/12.482632
KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Failure analysis, Electroluminescence, Transmission electron microscopy, Reverse modeling, Fiber optics, Modulation, Semiconducting wafers, Resistance
Proceedings Article | 17 June 2003 Paper
Characterization of failure mechanisms for oxide VCSELs
Scott McHugo, A. Krishnan, Joachim Krueger, Yong Luo, Ningxia Tan, Tim Osentowski, Suning Xie, Myrna Mayonte, Robert Herrick, Qing Deng, Mike Heidecker, David Eastley, Mark Keever, Christophe Kocot
Proceedings Volume 4994, (2003) https://doi.org/10.1117/12.482637
KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Optical inspection, Failure analysis, Electroluminescence, Reliability, Metals, Contamination, Humidity, Transmission electron microscopy
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