Prof. Joachim Wollschläger
at Univ Osnabrück
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 February 2016
Proc. SPIE. 9749, Oxide-based Materials and Devices VII
KEYWORDS: Oxides, Diffraction, Iron, Optical properties, Electrodes, Crystals, X-rays, X-ray diffraction, Nickel, Electrons, Interfaces, Magnetism, Kerr effect, Reflectometry, Synchrotron radiation

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