Prof. Joachim Wollschläger
at Univ Osnabrück
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 February 2016 Paper
Joachim Wollschläger, Tobias Schemme, Olga Kuschel, Matthäus Witziok, Timo Kuschel, Karsten Kuepper
Proceedings Volume 9749, 974917 (2016) https://doi.org/10.1117/12.2219627
KEYWORDS: Magnetism, Oxides, X-ray diffraction, Reflectometry, Synchrotron radiation, Kerr effect, Electrodes, Interfaces, Optical properties, Nickel, Iron, Diffraction, Electrons, Crystals, X-rays

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