Dr. Joana C. Alves
at European Space Agency
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 December 2016 Paper
H. Schroeder, M. Hippler, P. Allenspacher, W. Riede, A. Ciapponi, A. Mateo, T. Ivanov, J. Alves, J. Piris, C. Heese, D. Wernham
Proceedings Volume 10014, 100141K (2016) https://doi.org/10.1117/12.2244507
KEYWORDS: Laser ablation, Ceramics, Laser damage threshold, Particles, Aluminum, Scanning electron microscopy, Silicon carbide, Inspection, Copper, Microscopy

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