Dr. Joanna Schmit
Optical Engineer at 4D Technology Corp
SPIE Involvement:
| Board of Directors | Education Committee | Fellows Committee | Nominating Committee | Publications Committee | Scholarship Committee | Fellow status | Conference Program Committee | Conference Chair | Author | Editor
Publications (35)

PROCEEDINGS ARTICLE | September 1, 2015
Proc. SPIE. 9576, Applied Advanced Optical Metrology Solutions
KEYWORDS: Microscopes, Mirrors, Visualization, Cameras, Image processing, Interferometry, 3D metrology, Objectives, 3D image processing, RGB color model

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Microscopes, Mirrors, Interferometers, Scanners, Error analysis, Demodulation, 3D metrology, Optical interferometry, 3D scanning, Spherical lenses

SPIE Journal Paper | September 17, 2014
OE Vol. 53 Issue 09
KEYWORDS: Optical fabrication, Optical testing, Optics manufacturing, Metrology, Optical engineering, Optical components, Surface finishing, Precision optics, Thin films, Magnetorheological finishing

SPIE Conference Volume | July 18, 2014

PROCEEDINGS ARTICLE | May 28, 2014
Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III
KEYWORDS: Microscopes, Mirrors, Metrology, Light emitting diodes, Manufacturing, Interferometry, Sapphire, 3D metrology, Objectives, Temperature metrology

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8483, Tribute to William Wolfe
KEYWORDS: Visible radiation, Polishing, Roads, Iron, Curtains, Radio optics, Laser applications, Optical testing, Infrared radiation, Radiometry

Showing 5 of 35 publications
Conference Committee Involvement (25)
Interferometry XIX
21 August 2018 | San Diego, California, United States
Optical Manufacturing and Testing XII
20 August 2018 | San Diego, California, United States
Interferometry XVIII
30 August 2016 | San Diego, California, United States
Optical Manufacturing and Testing XI
9 August 2015 | San Diego, California, United States
Interferometry XVII: Techniques and Analysis
17 August 2014 | San Diego, California, United States
Showing 5 of 25 published special sections
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